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(crystals, macromolecules, living organisms, etc.) Measurement of High Retardation Level (R *>3λ) For easier measurement and high image contrast, the Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view. Measurement retardation level ranges from 0 to 20λ. Six different compensators are available for measurements of birefringence in rock and mineral thin sections. The frames are outfitted with ESD capability to protect electronic samples.Īn Extensive Range of Compensator and Wave Plates Both frames can be configured with manual, coded, or motorized components. There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted light. Modular design enables various configurations to meet users’ requirements.īelow you can find some examples of configuration for materials science.īX53M Reflected and Reflected/Transmitted Light Combination *T-BF can be used when selecting Reflected/Transmitted microscope frame.Įxample Configurations for Materials Science T-BF: Brightfield (Reflected/Transmitted)ĭIC: Differential interference contrast / Simple polarization Select from 5 stages based on the size of your samples Select from 3 objectives based on your applications

Stable Color Temperature and High-Intensity White LED Illuminationĭesigned to use Infrared observation to inspect integrated circuitsĭesigned for observing birefringence characteristics.

Olympus’ history of developing high-quality optics has resulted in a record of proven optical quality and microscopes that offer excellent measurement accuracy.

Adaptable to Suit Observational and Analysis Preferences.

New illumination techniques and options for image acquisition within OLYMPUS Stream image analysis software give users more choices of how to evaluate their samples and document findings. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. The BX53M maintains the traditional contrast methods of conventional microscopy, such as brightfield, darkfield, polarized light, and differential interference contrast. OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Automated Detection Technology Software.Aerospace/Wind Blade Inspection Scanners.Flaw Detectors / Phased Array Flaw Detectors ▾.

Thickness and Flaw Inspection Solutions ▾.